摘要：
An enhanced measurement of the microwave (MW) electric (E) fieldis proposed using an optical gratingin Rydberg atoms. Electromagnetically induced transparency (EIT) of Rydberg atoms appears driven by a probe field and a control field. The EIT transmission spectrum is modulated by an optical grating. When a MW field drives the Rydberg transition, the central principal maximum of the grating spectrum splits. It is interesting to find that the magnitude of the sharp grating spectrum changes linearly with the MW E-field strength, which can be used to measure the MW E-field. The simulation result shows that the minimum detectable E-field strength is nearly 1/8 of that without gratings, and its measurement accuracy could be enhanced by about 60 times. Other discussion of MW metrology based on a grating spectrum is also presented.
作者：
Shengfang Zhao, Zheng Yin, Xiaoyun Song, Zhengmao Jia, Leqiu Wang, Bing Chen, Qingtian Zeng, and Yandong Peng
链接：
https://opg.optica.org/ao/abstract.cfm?uri=ao-62-14-3747
